Download:
bringing_polymer_patterns_into.jpg
This image was acquired from
wikimedia. It was marked as Public Domain or CC0 and is free to use. To verify, go to the source and check the information there.
Keywords from Image Description:
Bringing Polymer Patterns into Focus . Working at the NIST Center for Neutron Research chemical engineer Eric Lin places semiconductor wafer in the path of focused neutron beam The beam is used to determine the size and shape of polymer patterns on the silicon wafer Twentyeight magnesium fluoride lenses focus the neutron beam so