This image was acquired from
wikimedia. It was marked as Public Domain or CC0 and is free to use. To verify, go to the source and check the information there.
Keywords from Image Description:
Hybrid Metrology Computer Chip . This tiny silicon pillar measuring less than nanometers along any of its sides is the sort of computer chip feature that manufacturers now can measure more precisely with NIST's hybrid metrology method which can reduce the nagging uncertainties that have long plagued industry's measurement efforts